此程序仅做参考之用

//setup clocking
	mclkset ( 10.24 );
    mclkmode ( MCLK_CH0, MCLK_CLOCK, 128, 0.0 ); //1KHZ   //80k=10240/128
	mclkmode( MCLK_CH1, MCLK_CLOCK, 70, 0.0 );
    mclksequence ( MCLK_CH0, " 4000, ON" );//APU to Input
	mclksequence( MCLK_CH1, "1000,OFF,1024, ON" );

	//VIN AWG loading
	mclkchannel ( MCLK_CH0, GP_MCLK_AUDIO_INPUT );
	mclkchannel( MCLK_CH1, GP_MCLK_AUDIO_OUT );
	double Vinp=0;
	int i=0;
	//2V
	Vinp=2;
	for (i =0;i <4000; i++ )
	AUDIO_IN[i] = Vinp/2*sin(2.0*PI*i/80);   //creat a sin wave and f=1k vop-p=2.2v
	apuawgloader ( GP_AUDIO_INPUT, "Vinp4000", APU_FV, APU_10V, APU_100MA,AUDIO_IN, 4000);
	namearray ( "Vinp4000", NAMEARRAY_APUAWG, GP_AUDIO_INPUT, 1 );

	mclkchannel ( MCLK_CH0, "OFF" );



// Test Function: OP_SH
ETS_PRGFLOW_FUNC OP_SH( int DSIndex, LPCTSTR TestLabel )
{
    //////////////////////////////////////
    // Update test numbering information
    SetTestNumber( TestNmbr[DSIndex] );
    SetSubTestNumber( SubTestNmbr[DSIndex] );

    RESULTS_STR Result1[2];
    int site;
	fssset( GP_VCC, FSS_FV, 0, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
	lwait(5000);

	for(int i=0;i<10;i++)
	{
		switch(i)
		{
		case 0:
			{
				apuset( GP_INP, APU_FI, -0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(2000);
				apumv( GP_INP, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_INP, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
	         	break;
			 }
		case 1:
			{
				apuset( GP_VI4, APU_FI, -0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VI4, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VI4, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 2:
			{
				apuset( GP_SD, APU_FI, -0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(2000);
				apumv( GP_SD, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_SD, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 3:
			{
				apuset( GP_VO2, APU_FI, -0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VO2, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VO2, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 4:
			{
				apuset( GP_VO1, APU_FI, -0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VO1, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VO1, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }

    	case 5:
			{
				apuset( GP_INP, APU_FI, 0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_INP, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_INP, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
	         	break;
			 }
		case 6:
			{
				apuset( GP_VI4, APU_FI, 0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VI4, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VI4, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 7:
			{
				apuset( GP_SD, APU_FI, 0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(2000);
				apumv( GP_SD, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_SD, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 8:
			{
				apuset( GP_VO2, APU_FI, 0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VO2, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VO2, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }
		case 9:
			{
				apuset( GP_VO1, APU_FI, 0.1, APU_10V, APU_1MA, PIN_TO_VI );
				lwait(3000);
				apumv( GP_VO1, 10, 10 );
				groupgetresults(Result1,NUM_SITES);
				apuset( GP_VO1, APU_VIOFF, 0, APU_10V, APU_1MA, PIN_TO_VI );
				break;
			 }

		}

		FOR_EACH_SITE(site,NUM_SITES)
		{
			msLogResult(site, DSIndex+i, Result1[site].value);
		}

	}


	
	return( msSiteStat( MS_ALL ) ); // Return w/status

} // END_ETS_PRGFLOW_FUNC



// Test Function: IQ
ETS_PRGFLOW_FUNC IQ( int DSIndex, LPCTSTR TestLabel )
{
    //////////////////////////////////////
    // Update test numbering information
    SetTestNumber( TestNmbr[DSIndex] );
    SetSubTestNumber( SubTestNmbr[DSIndex] );
    
	RESULTS_STR Result1[2];
	double Icc[NUM_SITES];
    int site;
    
	//VCC=3.6V
	apuset( GP_SD, APU_FV, 0, APU_10V, APU_1MA, PIN_TO_VI );
    lwait(5000L);
	fssset( GP_VCC, FSS_FV, 3.6, FSS_1MA, FSS_NOCLAMP , FSS_NOCLAMP );
	//SD=0V
    lwait(5000L);
	fssset( GP_VCC, FSS_FV, 3.6, FSS_100UA, FSS_NOCLAMP , FSS_NOCLAMP );
    lwait(5000L);
	fssmi( GP_VCC, 50, 50);
	groupgetresults ( Result1,NUM_SITES );

	FOR_EACH_SITE(site,NUM_SITES)
	{
	   	Icc[site]=Result1[site].value*1e3f;
		msLogResult(site, DSIndex, Icc[site]);
	}
 	apuset( GP_SD, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	fssset( GP_VCC, FSS_OFF, 0.0, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
    

	return( msSiteStat( MS_ALL ) ); // Return w/status
} // END_ETS_PRGFLOW_FUNC

// Test Function: ICC
ETS_PRGFLOW_FUNC ICC( int DSIndex, LPCTSTR TestLabel )
{
    //////////////////////////////////////
    // Update test numbering information
    SetTestNumber( TestNmbr[DSIndex] );
    SetSubTestNumber( SubTestNmbr[DSIndex] );
     
	RESULTS_STR Result1[2];
	double Icc[NUM_SITES];
    int site;

     cbitclose(GP_CB_K3);
	//VCC=3.6V
	fssset( GP_VCC, FSS_FV, 3.6, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
	//SD=0V
	apuset( GP_SD, APU_FV, 3.6, APU_10V, APU_10MA, PIN_TO_VI );
	lwait(10000L);
	fssmi( GP_VCC, 50, 20);
	groupgetresults ( Result1,NUM_SITES );

	FOR_EACH_SITE(site,NUM_SITES)
	{
	   	Icc[site]=Result1[site].value;
		msLogResult(site, DSIndex, Icc[site]);
	}
	apuset( GP_SD, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	fssset( GP_VCC, FSS_OFF, 0.0, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
 	lwait(5000L);
   return( msSiteStat( MS_ALL ) ); // Return w/status
} // END_ETS_PRGFLOW_FUNC

// Test Function: VCOM
ETS_PRGFLOW_FUNC VCOM( int DSIndex, LPCTSTR TestLabel )
{
    //////////////////////////////////////
    // Update test numbering information
    SetTestNumber( TestNmbr[DSIndex] );
    SetSubTestNumber( SubTestNmbr[DSIndex] );
     
    RESULTS_STR Result1[2],Result2[2];
	double VCOM[NUM_SITES];
    int site;	

     cbitclose(GP_CB_K1,GP_CB_K3);
	 apuset( GP_AUDIO_INPUT, APU_FV, 0, APU_10V, APU_100MA, PIN_TO_VI );
     lwait(2000L);

	//VCC=3.6V
	fssset( GP_VCC, FSS_FV, 3.6, FSS_1A, FSS_NOCLAMP , FSS_NOCLAMP );
	//SD=0V
	apuset( GP_SD, APU_FV, 3.6, APU_10V, APU_10MA, PIN_TO_VI );
	lwait(10000L);

	apuset( GP_BYPASS, APU_FI, 0, APU_10V, APU_1MA, PIN_TO_VI );
	lwait(200000L);
    apumv( GP_BYPASS, 40, 10);
	groupgetresults ( Result1,NUM_SITES );
	apuset( GP_BYPASS, APU_VIOFF, 0, APU_10V, APU_10MA, PIN_TO_VI );
	FOR_EACH_SITE(site,NUM_SITES)
	{
	   	VCOM[site]=Result1[site].value;
		msLogResult(site, DSIndex, VCOM[site]);
	}
	apuset( GP_VO1, APU_FI, 0, APU_10V, APU_1MA, PIN_TO_VI );
	apuset( GP_VO2, APU_FI, 0, APU_10V, APU_1MA, PIN_TO_VI );
	lwait(50000L);
	apumv( GP_VO1, 10, 20);
	groupgetresults ( Result1,NUM_SITES );
    apumv( GP_VO2, 10, 20);
	groupgetresults ( Result2,NUM_SITES );
	apuset( GP_VO1, APU_VIOFF, 0, APU_10V, APU_10MA, PIN_TO_VI );
	apuset( GP_VO2, APU_VIOFF, 0, APU_10V, APU_10MA, PIN_TO_VI );
	FOR_EACH_SITE(site,NUM_SITES)
	{
	   	VCOM[site]=Result1[site].value;
		msLogResult(site, DSIndex+1, VCOM[site]);
	   	VCOM[site]=Result2[site].value;
		msLogResult(site, DSIndex+2, VCOM[site]);
	   	VCOM[site]=(Result1[site].value-Result2[site].value)*1e3f;
		msLogResult(site, DSIndex+3, VCOM[site]);
	}
 
   
    return( msSiteStat( MS_ALL ) ); // Return w/status
} // END_ETS_PRGFLOW_FUNC

// Test Function: GAIN
ETS_PRGFLOW_FUNC GAIN( int DSIndex, LPCTSTR TestLabel )
{
    //////////////////////////////////////
    // Update test numbering information
    SetTestNumber( TestNmbr[DSIndex] );
    SetSubTestNumber( SubTestNmbr[DSIndex] );
     
//	RESULTS_STR thd_t[NUM_SITES];


//	int i;
	int state[NUM_SITES];
	state[0]=0;
	state[1]=0;
    RESULTS_STR Result1[2],Result2[2],results3[2];
	double Vout[NUM_SITES];
    int site;	
	
	//load OPEN
    cbitclose(GP_CB_K1,GP_CB_K2,GP_CB_K3);
	lwait(5000L);

	//VCC=3.6V
    apuset( GP_AUDIO_INPUT, APU_FVAWG, 0, APU_10V, APU_100MA, PIN_TO_VI );
	apuawgselect ( GP_AUDIO_INPUT, "Vinp4000", 1, 4000, 0 );
	mclkchannel ( MCLK_CH0,GP_MCLK_AUDIO_INPUT );

    fssset( GP_AUDIO_OUT, FSS_FI, 0.0, FSS_1A, FSS_NOCLAMP, FSS_NOCLAMP );
	fssadcmode( GP_AUDIO_OUT, FSS_MV, 1 );
	mclkchannel ( MCLK_CH1,GP_MCLK_AUDIO_OUT );
	lwait(3000l);
   	mclkstart ( MCLK_SGL, 0 );
	lwait(3000l);
	mclkstop ();
	blockread ( GP_AUDIO_OUT, 1024 );
	namearray ( "AUDIO_OUT", NAMEARRAY_FSSADC, GP_AUDIO_OUT, 1 );

	peak("AUDIO_OUT",500,1000,PEAK_LO);
	groupgetresults ( Result1,NUM_SITES );

	peak("AUDIO_OUT",500,1000,PEAK_HI);
	groupgetresults ( Result2,NUM_SITES );

	FOR_EACH_SITE(site,NUM_SITES)
	{
		Vout[site]=Result2[site].value-Result1[site].value;

		msLogResult(site, DSIndex, Vout[site]);
	}
////////////////////thd///////////////////////////////////////////////////

	psd( "AUDIO_OUT", "GP_PSD", 1, 1024 );
	thd( "GP_PSD", 8, 15, 20, 0 );
	groupgetresults(results3,NUM_SITES );	
    FOR_EACH_SITE( site, NUM_SITES)
	{	
		Vout[site]= results3[site].value;
	    msLogResult( site, DSIndex+1, Vout[site]);
	 }

	mclkchannel ( MCLK_CH0, "OFF" );
	mclkchannel ( MCLK_CH1, "OFF" );

	fssset( GP_VCC, FSS_OFF, 0.0, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
	fssset( GP_AUDIO_OUT, FSS_OFF, 0.0, FSS_10MA, FSS_NOCLAMP , FSS_NOCLAMP );
	apuset( GP_AUDIO_INPUT, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_BYPASS, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_INP, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_SD, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_VI4, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_VO2, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
	apuset( GP_VO1, APU_VIOFF, 0, APU_30V, APU_100MA, PIN_TO_VI );
     
    return( msSiteStat( MS_ALL ) ); // Return w/status
} // END_ETS_PRGFLOW_FUNC


功率测试未列出，请读者参考上一项进行编写